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Introduction

This meeting addresses all aspects of Surface Analysis with a special focus on challenges currently being addressed and recent improvements in technologies. The meeting will look at methods; XPS, SIMS, AES, AFM and other surface analysis equipment and instrumentation with the intention of improving the knowledge of surface analysis techniques and the awareness and benefits for industry. Surface analysis is of particular importance for examining adhesion, composition, corrosion, coatings, contaminants, semiconductors, structures and tomography.

Deadlines

• Jun 29 2018
  Oral abstracts deadline

  
• Sep 10 2018
  Poster abstract deadline

  

Useful links

Downloads

• Surface Analysis - Innovations and Solutions for Industry - Announcement and Call for Abstracts

Speakers

• Professor James O’Shea University of Nottingham, United Kingdom
• Dr Barry Brennan National Physical Laboratory, United Kingdom
• Dr David Morgan Cardiff University, United Kingdom
• Dr. Alex Walton University of Manchester, United Kingdom
• Dr Tien-Lin Lee Diamond Light Source, United Kingdom

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Sponsorship & supporting organisations

IoP - Thin Films and Surfaces Group
IoP - Ion and Plasma Surface Interaction Group

Venue

Ricoh Arena

Ericsson Hall, Ricoh Arena, Ricoh Arena, Phoenix Way, Coventry, CV6 6GE, United Kingdom

Useful links

Committee

• Dr Mark Baker University of Surrey, United Kingdom
• Dr David Scurr University of Nottingham, United Kingdom
• Dr Alex Shard National Physical Laboratory, United Kingdom
• Ian Owen Scanwel Ltd, United Kingdom

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Organised by

Enlighten Meetings
Xmark Media Ltd

Contact information

Brenda Hargreaves
Xmark Media Ltd
Old Village Hall, The Street, Effingham, Surrey KT24 5JS
07786558205
Contact us by email

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